JPH022085B2 - - Google Patents

Info

Publication number
JPH022085B2
JPH022085B2 JP58187593A JP18759383A JPH022085B2 JP H022085 B2 JPH022085 B2 JP H022085B2 JP 58187593 A JP58187593 A JP 58187593A JP 18759383 A JP18759383 A JP 18759383A JP H022085 B2 JPH022085 B2 JP H022085B2
Authority
JP
Japan
Prior art keywords
circuit
zero point
temperature
old
output
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP58187593A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6079224A (ja
Inventor
Fumiaki Tsukasa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Anritsu Corp
Original Assignee
Anritsu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Anritsu Corp filed Critical Anritsu Corp
Priority to JP58187593A priority Critical patent/JPS6079224A/ja
Publication of JPS6079224A publication Critical patent/JPS6079224A/ja
Publication of JPH022085B2 publication Critical patent/JPH022085B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D18/00—Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00
    • G01D18/002—Automatic recalibration

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Indication And Recording Devices For Special Purposes And Tariff Metering Devices (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)
JP58187593A 1983-10-06 1983-10-06 基準点補正装置 Granted JPS6079224A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58187593A JPS6079224A (ja) 1983-10-06 1983-10-06 基準点補正装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58187593A JPS6079224A (ja) 1983-10-06 1983-10-06 基準点補正装置

Related Child Applications (2)

Application Number Title Priority Date Filing Date
JP1147364A Division JPH0228516A (ja) 1989-06-10 1989-06-10 基準点補正装置
JP1147363A Division JPH0228515A (ja) 1989-06-10 1989-06-10 基準点補正装置

Publications (2)

Publication Number Publication Date
JPS6079224A JPS6079224A (ja) 1985-05-07
JPH022085B2 true JPH022085B2 (en]) 1990-01-16

Family

ID=16208819

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58187593A Granted JPS6079224A (ja) 1983-10-06 1983-10-06 基準点補正装置

Country Status (1)

Country Link
JP (1) JPS6079224A (en])

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0410790U (en]) * 1990-05-18 1992-01-29

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2000063750A1 (fr) * 1999-04-19 2000-10-26 Seiko Instruments Inc. Horloge a detecteur, systeme d'entree de donnees d'une telle horloge, procede d'entree de donnees pour une telle horloge, et support d'enregistrement lisible par ordinateur, comportant le programme pour la mise en oeuvre dudit procede par l'ordinateur
JP5403793B2 (ja) * 2009-04-21 2014-01-29 株式会社タニタ 重量測定装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0410790U (en]) * 1990-05-18 1992-01-29

Also Published As

Publication number Publication date
JPS6079224A (ja) 1985-05-07

Similar Documents

Publication Publication Date Title
US3378676A (en) System employing plural time-spaced average computations for measuring a second variable characteristic imparted to a material initially having a first variable characteristic
EP0600737A2 (en) Disc device
EP0704048A1 (en) Dither signal remover for dithered ring laser gyro
IE45354B1 (en) Measuring instruments
CN106199166A (zh) 一种电流测量的方法及装置
CA1328686C (en) Method and apparatus for detecting position of tape when recording or reproducing signals thereon
JPH022085B2 (en])
US3878457A (en) Thin film thickness measuring apparatus using an unbalanced inductive bridge
US3622764A (en) Method of determining the drift of a gyrocompass
US4227129A (en) Apparatus for detecting the speed of an electric motor
JPH0150848B2 (en])
JPS60131404A (ja) 膜厚測定装置
US3729999A (en) Barometric altimeter
JPS60115804A (ja) 塗工量測定方法および装置
JPH0560043B2 (en])
JPH05126596A (ja) 基準点補正装置
JPH0315121B2 (en])
JPS6196413A (ja) 流量計用器差補正装置
JP2798428B2 (ja) 磁性薄膜の磁化特性測定方法
GB1311197A (en) Method and apparatus for measuring thickness of sheet material
JPS63302311A (ja) 測長用スケ−ル
SU1146542A1 (ru) Способ поверки толщиномеров неметаллических покрытий
SU724918A1 (ru) Устройство дл измерени толщины металлических покрытий
SU1012012A1 (ru) Толщиномер
JPH0321048B2 (en])